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新澳门六合彩开奖 Cloud
新澳门六合彩开奖 Cloud

Cloud native EDA tools & pre-optimized hardware platforms

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Multi-Die System Solution
Multi-Die System Solution

A comprehensive solution for fast heterogeneous integration

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Explore Silicon Design, Verification & Manufacturing

新澳门六合彩开奖 is a leading provider of electronic design automation solutions and services.

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Optical Design
Photonic Design
Design
3D Image Processing
Verification
Modeling & Simulation
Manufacturing
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新澳门六合彩开奖 Cloud

Unlimited access to EDA software licenses on-demand

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Explore Silicon IP

新澳门六合彩开奖 is a leading provider of high-quality, silicon-proven semiconductor IP solutions for SoC designs.

Interface IP
Processor IP
Analog IP
Memories & Libraries
SoC Architecture
Security IP
SoC Infrastructure IP
IP Accelerated
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新澳门六合彩开奖 IP Portfolio
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Explore Application Security

新澳门六合彩开奖 helps you protect your bottom line by building trust in your software—at the speed your business demands.

Integrated AppSec 新澳门六合彩开奖
Software Risk Analysis
AppSec Program Services
Your guide to securing your open source supply chain
Your guide to securing your open source supply chain
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Success Stories | 新澳门六合彩开奖
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Chip Design

Chip Design

Insights on silicon IP, design, verification & manufacturing.

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Application Security

Application Security

Insights on application security and DevSecOps.

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Optical & Photonics

Optical & Photonics

Insights on optical and photonic design.

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Recent Stories

Accelerate RISC-V Verification Using 新澳门六合彩开奖 Cloud
Blog
3 min read / Jun 26, 2024

Accelerate RISC-V Verification Using 新澳门六合彩开奖 Cloud

Anuj Pant
By Anuj Pant
Tags: Verification Central, Cloud, Verification
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The Dynamic Traceability Method: Revolutionizing Software Testing
Blog
2 min read / Jun 26, 2024

The Dynamic Traceability Method: Revolutionizing Software Testing

Robert Fey
By Robert Fey
Tags: Design, Automotive, Test Automation, Verification
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Imec and 新澳门六合彩开奖 Lower the Barriers to 2nm Technology With New Pathfinding Design Kit
Blog
3 min read / Jun 25, 2024

Imec and 新澳门六合彩开奖 Lower the Barriers to 2nm Technology With New Pathfinding Design Kit

Kritti Pathak
AV
By Kritti Pathak , Alec Vogt
Tags: Chip Design Insights, Design, Inside 新澳门六合彩开奖
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How Chip Makers Are Defying Complexity and Innovating Faster
Blog
3 min read / Jun 24, 2024

How Chip Makers Are Defying Complexity and Innovating Faster

Shankar Krishnamoorthy
By Shankar Krishnamoorthy
Tags: AI & Machine Learning, Chip Design Insights, Design
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新澳门六合彩开奖 SoC Verification Kit – Delivering Out-of-the-box SoC Verification Solution
Blog
3 min read / Jun 18, 2024

新澳门六合彩开奖 SoC Verification Kit – Delivering Out-of-the-box SoC Verification Solution

Varun Agrawal
By Varun Agrawal
Tags: AI & Machine Learning, Memory, Verification IP, Automotive, HPC, Data Center, Verification
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新澳门六合彩开奖 and Alchip Collaborate to Streamline the Path to Multi-die Success with Soft Chiplets
Blog
3 min read / Jun 17, 2024

新澳门六合彩开奖 and Alchip Collaborate to Streamline the Path to Multi-die Success with Soft Chiplets

Manmeet Walia
Manuel Mota
By Manmeet Walia , Manuel Mota , Erez Shaizaf
Tags: Multi-Die System, Chip Design Insights
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